| 2022-11-23 |
Characterization of Stochastic Process Variability Effects on Nano-Scale Analog Circuits
|
Dhiman, R. (Ed.). (2022). Nanoelectronics for Next-Generation Integrated Circuits, CRC Press, USA |
9781003155751 |
Author |
10 |
1-18 |
| 2020-10-04 |
Design Methodology for Ultra‐Low‐Power CMOS Analog Circuits for ELF‐SLF Applications
|
Nanoscale VLSI, Editors: Dr. Rohit Dhiman, Dr. Rajeevan Chandel - Publisher: Springer Singapore |
Print ISBN 978-981-15-7936-3 Online ISBN 978-981-15-7937-0 |
S.Pandit |
10 |
23–43 |
| 2019-12-17 |
CMOS Design and Analysis of Four Quadrant Analog Multiplier Circuit for LF Applications
|
In: Kundu, S., Acharya, U., De, C., Mukherjee, S. (eds) Proceedings of the 2nd International Conference on Communication, Devices and Computing. Lecture Notes in Electrical Engineering, vol 602. Springer, Singapore. |
Print ISBN 978-981-15-0828-8 Online ISBN 978-981-15-0829-5 |
Co-Author |
5 |
pp 279–289 |
| 2019-09-01 |
UTB III‐V‐OI‐Si MOS Transistor: the future Transistor for VLSI Design
|
VLSI and Post-CMOS Electronics, Edited by R.Dhiman and R.Chandell, IET, UK. |
ISBN: 9781839530531 e-ISBN: 9781839530548 |
Author |
7 |
Volume 2, 27 –45 (19) |
| 2019-08-18 |
Design of a Health Monitoring System for Heart Rate and Body Temperature Sensing Including Embedded Processing using ARM Cortex M3
|
In: Das, A., Nayak, J., Naik, B., Pati, S., Pelusi, D. (eds) Computational Intelligence in Pattern Recognition. Advances i |
Print ISBN 978-981-13-9041-8 Online ISBN 978-981-13-9042-5 |
Co-author |
3 |
93–103 |
| 2018-12-12 |
MOSFET Characterization for VLSI Circuit Simulation
|
Sarkar, C.K. (Ed.). (2013). Technology Computer Aided Design: Simulation for VLSI MOSFET (1st ed.). CRC Press. |
eBook ISBN9781315216454 |
Author |
10 |
96 pages |
| 2018-11-28 |
Variability in Nanoscale MOS Transistor and EδDC MOS Transistor
|
Nanoscale Devices: Physics, Modeling and their Application, CRC Press, USA., Editor: B.K.Kaushik, Chapter 2 |
eBook ISBN: 9781315163116 |
Co-author |
5 |
1-26 |
| 2018-10-01 |
Nano‐Scale CMOS Analog Circuits: Models and CAD Techniques for High‐Level Design
|
CRC Press, USA, Taylor & Francis, UK and others |
Print ISBN: 978‐1‐ 4665‐6426‐8, eBook ISBN: 978‐ 1‐4665‐6428‐2 |
Author |
10 |
408 |
| 2018-04-08 |
Behavioral Modeling of Differential Inductive Seismic Sensor and Implementation of Its Readout Circuit.
|
In: Bhaumik, J., Chakrabarti, I., De, B., Bag, B., Mukherjee, S. (eds) Communication, Devices, and Computing. Lecture Notes in Electrical Engineering, vol 470. Springer, Singapore. |
Print ISBN 978-981-10-8584-0 Online ISBN 978-981-10-8585-7 |
Co-author |
3 |
253–262 |
| 2015-07-02 |
Nanoscale MOSFET: MOS Transistor as Basic Building Block
|
In: Sengupta, A., Sarkar, C. (eds) Introduction to Nano. Engineering Materials. Springer, Berlin, Heidelberg. |
Print ISBN 978-3-662-47313-9 Online ISBN 978-3-662-47314-6 |
Author |
10 |
145–172 |
| 2011-12-08 |
Statistical Characterization of Flicker Noise Fluctuation of a Nano‐Scale NMOS Transistor
|
In: Giri, P.K., Goswami, D.K., Perumal, A. (eds) Advanced Nanomaterials and Nanotechnology. Springer Proceedings in Physics, vol 143. Springer, Berlin, Heidelberg. |
Print ISBN 978-3-642-34215-8 Online ISBN 978-3-642-34216-5 |
Co-author |
5 |
203–214 |